Hitachi - Benchtop microspot XRF coating thickness analysers Get latest price

Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering easy-to-use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analyzing solids or liquids over a wide element range 13Al to 92U on the periodic table. 

X-Strata920

• Proportional counter or high resolution SDD
• Element range: Ti – U or Al – U (SDD)
• Chamber design : slotted
• XY stage options : fixed base, deep well, motorised
• Largest sample : 270 x 500 x 150 mm
• Maximum number of collimators : 6
• Filters : 1
• Smallest collimator : 0.01 x 0.25 mm (0.5 x10 mil)
• SmartLink software

To contact Hitachi High-Tech Analytical Science about Hitachi Benchtop microspot XRF coating thickness analysers use Get a quote.

Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering easy-to-use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analyzing solids or liquids over a wide element range 13Al to 92U on the periodic table. 

X-Strata920

• Proportional counter or high resolution SDD
• Element range: Ti – U or Al – U (SDD)
• Chamber design : slotted
• XY stage options : fixed base, deep well, motorised
• Largest sample : 270 x 500 x 150 mm
• Maximum number of collimators : 6
• Filters : 1
• Smallest collimator : 0.01 x 0.25 mm (0.5 x10 mil)
• SmartLink software

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To contact Hitachi High-Tech Analytical Science about Hitachi Benchtop microspot XRF coating thickness analysers use Get a quote.